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IMD is a point-and-click IDL application that can calculate the optical properties - reflectance, transmittance, and absorptance - of an arbitrary multilayer structure, i.e., a structure consisting of any number of layers of any thickness, and of any material. IMD includes a database of optical constants for over 150 materials, spanning the photon range from the X-ray region to the far infrared. It's also easy to use your own optical constants if necessary, or to create new X-ray optical constants for any compound, using the CXRO tabulated atomic scattering factors for 92 elements. IMD can be used for both modeling, and for parameter estimation by non-linear, least-squares curve-fitting (including confidence interval generation) to your own measured data. IMD can also compute the electromagnetic field intensity vs. depth in a multilayer structure.

Current Version:   3.1

License Type:  Free for Non-Commercial Use

Home Site:

Source Code Availability:   Yes

Available Binary Packages:

  • Debian Package:   No
  • RedHat RPM Package:   No
  • Other Packages:   No

Targeted Platforms:

IDL platform

Software/Hardware Requirements:

IDL 4.01B or higher (5.0 or higher for Windows platforms)

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